Papers

 

(2008)

1.         A. Shafie, S. Kawahito, H. J. Yoon, S. Ito, gA Dynamic Range Expansion Technique Using Dual Charge Storage in a CMOS APS and Multiple Exposures for Reduced Motion Blurh, J. Inst. Image Inf. TV Eng., vol.62, no.12, pp.2037-2044, Dec.2008.

2.         T. Sawada, K. Yasutomi, S.Itoh, gKawahito Laboratory, Shizuoka Universityh, Flesh Eyes –Introduction of Video Research Laboratory-, J. Inst. Image Inf. TV Eng., vol.62, no.11, pp.1737-1740, Nov.2008. (in Japanese).

3.         S. Kawahito, I. Takayanagi, H. Takahashi, S. Sugawa, T. Misawa, J. Ohta, T. Hamamoto, H. Ohtake, K. Harada, A. Onoda, gThe Recent Progress of Image Informationg and Television Engineers, Image Electron, Information Sensingh, J. Inst. Image Inf. TV Eng., vol.62, no.8, pp.1189-1197, Aug.2008. (in Japanese).

4.         S. Kawahito, gTechniques for Digitally Assisted Pipeline A/D Convertersh, IEICE Trans. Electron., vol.E91-C, no.6, pp.829-836, Jun. 2008. (invited)

5.         S. Shafie, S. Kawahito, S. Itoh, gA Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Samplingh, MDPI sensors 2008,8, pp.1915-1926, Mar.2008.

6.         S. Kawahito, gRecent Progress of Three-dimensional Range Findersh, J. Inst. Image Inf. TV Eng., vol.62, no.3, pp.313-316, Mar. 2008. (in Japanese).

7.         S. Kawahito, H. J. Yoon, S. Itoh, gA CMOS Time-Resolved Sensor for Fluorescence Lifetime Imagingh, The 10th Takayanagi Kenjiro Memorial Symp. / The 5th Int. Symp. Nanovision Sciene, Hamamatsu, Nov.2008.

8.         T. Sawada, K. Ito, M. Nakayama, S. Kawahito, gTOF Range Image Sensor Using A Range-Shift Techniquh, IEEE SENSORS2008, pp.1390-1393, Lecce, Italy, Oct.2008.

9.         T. Sawada, K. Ito, M. Nakayama, S. Kawahito, gA Range-Shift Technique for TOF Range Image Sensorsh, The 25th Sensor Symp. Sensors, Micromachines, and Applied Systems, D5-5, Okinawa, Oct.2008.

10.     K. Yasutomi, T. Tamura, M. Furuta, S. Itoh, S. Kawahito, gA High-Speed CMOS Image Sensor with Global Electronic Shutter Pixels Using Pinned Diodesh, The 25th Sensor Symp. Sensors, Micromachines, and Applied Systems, D5-3, Okinawa, Oct.2008.

11.     H. J. Yoon, S. Ito, S. Kawahito, gA CMOS Image Sensor using Two-Stage Charge Transfer Structure for Fluorescence Lifetime Imaging with 100ps Time-Resolutionh, The 25th Sensor Symp. Sensors, Micromachines, and Applied Systems , P-3-4(Poster), Okinawa, Oct.2008.

12.     S. Kawahito, K. Honda, Z. Liu, K. Yasutomi, S. Itoh, gA 15b Power-Efficient Pipeline A/D Converter Using Non-Slewing Closed-Loop Amplifiersh, IEEE Custom Integrated Circuits Conf., 7-7, pp.117-120, San Jose, Sept.2008.

13.     K. Yasutomi, T. Tamura, S. Ito, S. Kawahito, gA High-Speed CMOS Image Sensor with Global Electronic Shutter Pixel Using Pinned Diodesh, 7th Int. Conf. Global Research and Education Proceedings, pp.319-325, Pecs, Sept.2008.

14.     H.-J. Yoon, S. Itoh, S. Kawahito, gA CMOS Image Sensor using Two-Stage Charge Transfer Technique for Fluorescence Lifetime Imagingh, Euro Sensors 2008, W2A, pp.1474-1477, Dresden, Sept.2008.

15.     S. Itoh, S. Kawahito, gA low-power data transmission technique using inductive coupling and its application to biomedical sensor devicesh, 2008 CMOS Emerging Technologies Workshop, 11B, Vancouver, Aug. 2008.

16.     Z. Liu, K.Honda, S.Kawahito, gA New Calibration Method for Sampling Clock Skew in Time-Interleaved ADCh, Proc. IEEE Int. Inst. Measurement Tech. Conf., pp.1107-1110, Victoria, May. 2008.

17.     S. Kawahito, gCMOS Time-of-Flight Range Image Sensors, The 4th Fraunhofer IMS Workshop on CMOS-Imaging CD-R, Duisburg, May 2008. (invited)

18.     S. Kawahito, J-H. Park, K. Isobe, S. Suhaidi, T. Iida, T. Mizota, gA CMOS Image Sensor Integrating Column-Parallel Cyclic ADCs with On-Chip Digital Error-Correction Circuitsh, Dig. Tec. Papers 2008 IEEE Int. Solid-State Circuits Conf., pp.56-57, San Francisco, Feb.2008.

19.     S. B. Shafie, S. Kawahito, gA wide dynamic range image sensor with dual charge storage in a pixel and a multiple sampling techniqueh, Proc. SPIE Electronic Imaging 2008, vol.6816, San Jose, Jan.2008.

20.     S. Kawahito, S. Ito, gNoise calculation model and analysis of high-gain readout circuits for CMOS image sensorsh, Proc. SPIE Electronic Imaging 2008, vol.6816, San Jose, Jan.2008.