Papers

(2009)

1.         S.Kawahito,gRecent progress of CMOS imaging devices,h The 16th International Display Workshops(CD-R), INP1-1,Miyazaki,Dec.2009(Invited)

2.         M.A.Mustafa, S. Itoh, S. Kawahito,gReduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis,h Journal of Automation, Mobile, Robotics & Intelligent Systems, Vol.3, No.4, pp.202-203,2009

3.         S. Shafie, S. Kawahito, I. A. Halin, W. Z. W. Hasan, gNon-linearity in wide dynamic range CMOS image sensors utilizing a partial charge transfer technique,h Sensors2009,vol.9,no.12,pp.9452-9467, Dec.2009.

4.         J. H. Park, S. Aoyama, T. Watanabe, K. Isobe, S. Kawahito, gA high-speed low noise CMOS image sensor with 13-b column-parallel single-ended cyclic ADCs,h IEEE Trans. on Electron Devices,vol.56,no.11, pp.2414-2422,Nov.2009.

5.         T. Sawada, K. Ito, M. Nakayama, S. Kawahito,gA range-shift technique for TOF range image sensors,h IEEJ Trans. on Sensors and Micromachines, vol.129, no.11,Sec.E, pp.421-425, Nov.2009.

6.         M. S. Z. Sarker, I. Takai, M. Andoh, K. Yasutomi, S. Itoh, S. Kawahito, gA CMOS imager and 2-D light pulse receiver array for spatial optical communication,h IEEE Asian Solid-State Circuits Conference(CD-R),pp.113-116,Taipei, Nov.2009

7.         S. Kawahito, gRecent progress of CMOS image sensors,h The 11th Takayanagi Kenjiro Memorial Symposium,program,Hamamatsu,Nov.2009

8.         K. Yasutomi, T. Tamura, M. Furuta, S. Itoh, S. Kawahito,gA high-speed CMOS image sensor with global electronic shutter pixels using pinned diodes,h IEEJ Trans. on Sensors and Micromachines, vol.129, no.10, pp.321-327,Oct.2009.

9.         S. W. Jun, K. Yasutomi, S. Itoh, S. Kawahito,gLinearized settling error calibration for a pipeline A/D converter using non-slewing amplifiers,h Inter-Academia2009, vol.3,no.4, pp.204-206, Kazimierz,Sep.2009

10.     M. A. B. Mustafa, S. Itoh, S. Kawahito, gReduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis,hInter-Academia2009, vol.3,no.4, pp.202-203,Kazimierz,Sep.2009

11.     K. Yasutomi, S. Itoh, S. Kawahito, T. Tamura,gTwo-stage charge transfer pixel using pinned diodes for low-noise global shutter imaging,h Int. Image Sensor w/s,pp.333-336, Bergen,Jun.2009

12.     S. Kawahito, S. Suh, T. Shirei, S. Ito, gNoise reduction effect of column-parallel correlated multiple sampling for CMOS image sensors,hInt. Image Sensor w/s, Bergen, pp.320-323, Jun.2009

13.     T. Watanabe, J. H. Park, S. Aoyama, K. Isobe, S. Kawahito,gEffects of negative bias operation and optical stress on dark current,hInt. Image Sensor w/s, pp. 107-110,Bergen,Jun.2009(poster)

14.     S.Suh, S.Itoh, S.Kawahito, T.Shirei, S.Aoyama, C.Nishimura,gNoise reduction effect of column-parallel correlated multiple sampling for CMOS image sensors,hEOS Conferences 2009(CD-R), p.15, Munich,Jun.2009

15.     S. Kawahito, gCMOS Image Sensors Building Blocks,h UPM, Selangor, Malaysia, Mar.2009.(Invited)

16.     H. J. Yoon, S. Itoh, S. Kawahito, gA CMOS image sensor with in-pixel two-stage charge transfer for fluorescence lifetime imaging,h IEEE Trans. Electron Devices, vol.56,no.2, pp.214-221, Feb.2009.

17.     A. Matsuzawa, G. Gielen, M. Hershenson, S. Kawahito, S. Dosho, gHow to design the future mixed signal LSI's,h Proc. SASIMI2009, p.485, Okinawa, Mar.2009. (Invited, Panel discussion)

18.     J. H. Park, S. Aoyama, T. Watanabe, T. Akahori, T. Kosugi, K. Isobe, Y. Kaneko, Z. Liu, K. Muramatsu, T. Matsuyama, S. Kawahito, gA 0.1e -Vertical FPN 4.7e- Read Noise 71dB DR CMOS Image Sensor with 13b Column-Parallel Single-Ended Cyclic ADCs,h 2009 IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, 15-3, pp.268-269, San Francisco, Feb.2009.

19.     Md. S. Z. Sarker, I. Takai, M. Andoh, K. Yasutomi, S. Itoh, S. Kawahito, gA CMOS Active Pixel Sensor for Optical Communication,h IS&T Electronic Imaging Science and Tech., 7249-21, San Jose, Jan.2009.

20.     K. Yasutomi, T. Tamura, M. Furuta, S. Kawahito, S. Ito, S. Kawahito, gA global electronic shutter pixel using pinned diodes fabricated in standard CMOS-image sensor technology,h IS&T Electronic Imaging Science and Tech., 7249-14, San Jose, Jan.2009.