˜_•¶¥‰ðà

(2009)

1.         S.Kawahito,gRecent progress of CMOS imaging devices,h The 16th International Display Workshops(CD-R), INP1-1,Miyazaki,Dec.2009(Invited)

2.         M.A.Mustafa, S. Itoh, S. Kawahito,gReduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis,h Journal of Automation, Mobile, Robotics & Intelligent Systems, Vol.3, No.4, pp.202-203,2009

3.         S. Shafie, S. Kawahito, I. A. Halin, W. Z. W. Hasan, gNon-linearity in wide dynamic range CMOS image sensors utilizing a partial charge transfer technique,h Sensors2009,vol.9,no.12,pp.9452-9467, Dec.2009

4.         J. H. Park, S. Aoyama, T. Watanabe, K. Isobe, S. Kawahito, gA high-speed low noise CMOS image sensor with 13-b column-parallel single-ended cyclic ADCs,h IEEE Trans. on Electron Devices, vol.56,no.11, pp.2414-2422,Nov.2009

5.         T. Sawada, K. Ito, M. Nakayama, S. Kawahito,gA range-shift technique for TOF range image sensors,h IEEJ Trans. on Sensors and Micromachines, vol.129, no.11,Sec.E, pp.421-425, Nov.2009

6.         M. S. Z. Sarker, I. Takai, M. Andoh, K. Yasutomi, S. Itoh, S. Kawahito, gA CMOS imager and 2-D light pulse receiver array for spatial optical communication,h IEEE Asian Solid-State Circuits Conference(CD-R),pp.113-116,Taipei, Nov.2009

7.         S. Kawahito, gRecent progress of CMOS image sensors,h The 11th Takayanagi Kenjiro Memorial Symposium,program,Hamamatsu,Nov.2009

8.         K. Yasutomi, T. Tamura, M. Furuta, S. Itoh, S. Kawahito,gA high-speed CMOS image sensor with global electronic shutter pixels using pinned diodes,h IEEJ Trans. on Sensors and Micromachines, vol.129, no.10, pp.321-327,Oct.2009

9.         S. W. Jun, K. Yasutomi, S. Itoh, S. Kawahito,gLinearized settling error calibration for a pipeline A/D converter using non-slewing amplifiers,h Inter-Academia2009, vol.3,no.4, pp.204-206, Kazimierz,Sep.2009

10.     M. A. B. Mustafa, S. Itoh, S. Kawahito, gReduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis,hInter-Academia2009, vol.3,no.4, pp.202-203,Kazimierz,Sep.2009

11.     ìlË“ñ,‚Ó‚§[‚©‚·,gî•ñƒZƒ“ƒVƒ“ƒO‚ÆŽY‹Æ˜AŒgh,‰f‘œî•ñƒƒfƒBƒAŠw‰ïŽ,vol.63,no.8,Šª“ªƒy[ƒW,2009.8

12.     ìlË“ñ,Œ¤‹†Žº‚¾‚æ‚è,Ã‰ª‘åŠw“dŽqHŠwŒ¤‹†ŠƒCƒ[ƒWƒ“ƒOƒfƒoƒCƒX•ª–ì,“d‹CŠw‰ï˜_•¶Ž‚dCƒZƒ“ƒTƒ}ƒCƒNƒƒ}ƒVƒ“•”–厏vol..129 ,no.8,pp.272,2009.8

13.     K. Yasutomi, S. Itoh, S. Kawahito, T. Tamura,gTwo-stage charge transfer pixel using pinned diodes for low-noise global shutter imaging,h Int. Image Sensor w/s,pp.333-336, Bergen,Jun.2009

14.     S. Kawahito, S. Suh, T. Shirei, S. Ito, gNoise reduction effect of column-parallel correlated multiple sampling for CMOS image sensors,hInt. Image Sensor w/s, Bergen, pp.320-323, Jun.2009

15.     T. Watanabe, J. H. Park, S. Aoyama, K. Isobe, S. Kawahito,gEffects of negative bias operation and optical stress on dark current,hInt. Image Sensor w/s, pp. 107-110,Bergen,Jun.2009(poster)

16.     S.Suh, S.Itoh, S.Kawahito, T.Shirei, S.Aoyama, C.Nishimura,gNoise reduction effect of column-parallel correlated multiple sampling for CMOS image sensors,hEOS Conferences 2009(CD-R), pp15, Munich,Jun.2009

17.     ìlË“ñ,@Œ¤‹†ŽºÐ‰îg‚‘¬‚•ª‰ð”\A/D•ÏŠ·Ší‚Ì’á“d—͐݌v‹Zp‚ÉŠÖ‚·‚錤‹†,h”¼“±‘̐݌vÅ‘Oü2009@–¢—ˆ‚ðØ‚è‘ñ‚­”¼“±‘Ì‹Zp@“úŒoƒ}ƒCƒNƒƒfƒoƒCƒX“Á•Ê•ÒW”Å,@pp.84-85,2009

18.     S. Kawahito, gCMOS Image Sensors Building Blocks,h UPM, Selangor, Malaysia, Mar.2009.(Invited)

19.     H. J. Yoon, S. Itoh, S. Kawahito, gA CMOS Image Sensor with In-Pixel Two-Stage Charge Transfer for Fluorescence Lifetime Imaging,h IEEE Trans. Electron Devices, vol.56,no.2, pp.214-221, Feb.2009.

20.     A. Matsuzawa, G. Gielen, M. Hershenson, S. Kawahito, S. Dosho, gHow to design the future mixed signal LSI's,h Proc. SASIMI2009, p.485, Okinawa, Mar.2009. (Invited, Panel discussion)

21.     J. H. Park, S. Aoyama, T. Watanabe, T. Akahori, T. Kosugi, K. Isobe, Y. Kaneko, Z. Liu, K. Muramatsu, T. Matsuyama, S. Kawahito, gA 0.1e -Vertical FPN 4.7e- Read Noise 71dB DR CMOS Image Sensor with 13b Column-Parallel Single-Ended Cyclic ADCs,h 2009 IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, 15-3, pp.268-269, San Francisco, Feb.2009.

22.     Md. S. Z. Sarker, I. Takai, M. Andoh, K. Yasutomi, S. Itoh, S. Kawahito, gA CMOS Active Pixel Sensor for Optical Communication,h IS&T Electronic Imaging Science and Tech., 7249-21, San Jose, Jan.2009.

23.     K. Yasutomi, T. Tamura, M. Furuta, S. Kawahito, S. Ito, S. Kawahito, gA global electronic shutter pixel using pinned diodes fabricated in standard CMOS-image sensor technology,h IS&T Electronic Imaging Science and Tech., 7249-14, San Jose, Jan.2009.

 

‘“àŒû“ª”­•\

(2009)

1.      ìlË“ñ, gCMOS‹@”\WÏƒZƒ“ƒT,h IEEE–¼ŒÃ‰®Žx•” ‘‰ïFellow ŽóÜ‹L”Ou‰‰‰ï, –¼ŒÃ‰®, 2009.12.19

2.      à_ˆä”R‘¾,ˆÉ“¡^–ç,Md. Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,‚ˆä@—E,ˆÀ“¡“¹‘¥,ìlË“ñ, gŽÔŽÔŠÔE˜HŽÔŠÔŒõ’ʐM—pCMOSƒCƒ[ƒWƒZƒ“ƒT‚ÆLEDŒõŒ¹‚ð—p‚¢‚½’ʐM‹——£‚Ì•]‰¿ŽÀŒ±,h“dŽqî•ñ’ʐMŠw‰ïWÏ‰ñ˜HŒ¤‹†‰ï12ŒŽŒ¤‹†‰ïŠw¶EŽáŽèŒ¤‹†‰ï,•l¼, 2009.12.14(ƒ|ƒXƒ^[)

3.      ÂŽR‘,–pßá©,“n•Ó‹±Žu,ìlË“ñ, gƒCƒ[ƒWƒZƒ“ƒT@` ‚»‚Ì–£—͂Ɛ݌v‚̓‚³ `,h “dŽqî•ñ’ʐMŠw‰ïWÏ‰ñ˜HŒ¤‹†‰ï12ŒŽŒ¤‹†‰ïŠw¶EŽáŽèŒ¤‹†‰ï,•l¼, 2009.12.14(µ‘ҍu‰‰)

4.      ‚ˆä—E,‘¾“c[•F,–Ø‘ºDŽ,ˆÀ“¡“¹‘¥,Md.Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,à_ˆä”R‘¾,ˆÉ“¡^–ç,ìlË“ñ, gƒCƒ[ƒWƒZƒ“ƒT‚É‚æ‚éŽÔŽÔE˜HŽÔŠÔ’ʐM‚Ì‚½‚ß‚ÌŒõ‹óŠÔ’ʐMƒVƒXƒeƒ€,hViEW2009,‰¡•l,2009.12.3

5.      ìlË“ñ, g‹@”\WÏƒCƒ[ƒWƒ“ƒOƒfƒoƒCƒX‚Ɖ摜ƒZƒ“ƒVƒ“ƒO‚ւ̉ž—p,h ŽO•H“d‹@æ’[‹Zp‘‡Œ¤‹†Š,•ºŒÉ,2009.11.24(µ‘ҍu‰‰)                                                                               

6.      ìlË“ñ, gŽžŠÔ•ª‰ðŽB‘œƒfƒoƒCƒX‹Zp‚Ɖž—p- ‹É’ZŽžŠÔ‰ž“šƒsƒNƒZƒ‹‚ð—p‚¢‚½Œõ”òsŽžŠÔŒ^ƒŒƒ“ƒWƒtƒ@ƒCƒ“ƒ_AŒuŒõŽõ–½‚É’…–Ú‚µ‚½ƒoƒCƒIƒCƒ[ƒWƒ“ƒO‚ւ̉ž—p,h, JSTInnovation Bridge Ã‰ª‘åŠwŒ¤‹†ƒV[ƒY”­•\‰ï,“Œ‹ž,2009.10.19

7.      Z. Li,H.J. Yoon,S. Itoh,S.Kawahito, gTime domain fluorescence lifetime image sensor using two-stage charge transfer pixels with pinned diode,h ‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï@WÏ‰ñ˜HŒ¤‹†‰ï,“Œ‹ž, 2009.10.1

8.      ’|‰º—TÍE”Ñ“c“N–çEˆÀ•xŒ[‘¾EìlË“ñ, g–„‚ߍž‚ÝŒ^‚‘¬“d‰×“]‘—ƒtƒHƒgƒ_ƒCƒI[ƒh‚ð—p‚¢‚½TOF‹——£‰æ‘œƒZƒ“ƒT‚ÌŽŽì,h‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ïWÏ‰ñ˜HŒ¤‹†‰ï,“Œ‹ž, 2009.10.1

9.      “n•Ó‹±Žu, –pßá©,ÂŽR‘,ˆé•”Œ\Œá,ìlË“ñ, gCMOSƒCƒ[ƒWƒZƒ“ƒT‚̈Ód—¬‚ɑ΂·‚镉“dˆ³‹ì“®‚¨‚æ‚ÑŒõƒXƒgƒŒƒX‚ÌŒø‰Ê,h‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ïiISTj,“Œ‹ž, 2009.9.28

10.   S. Suh,S. Itoh,T. Iida,S. Kawahito, gNoise reduction effects of column-parallel multiple sampling circuits,h‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ïiISTj,“Œ‹ž, 2009.9.28

11.   ìlË“ñ, gCMOSƒCƒ[ƒWƒZƒ“ƒT‚Ì‹Zp“®Œü,h“dŽqƒWƒƒ[ƒiƒ‹‘æ216‰ñTechnical Symposium,2009HCCD/CMOSƒCƒ[ƒWƒZƒ“ƒT“O’ꌟØ,“Œ‹ž, 2009.9.25(µ‘ҍu‰‰)

12.   ìlË“ñ, g’´‚Š´“x”ñ—â‹pCMOSƒCƒ[ƒWƒZƒ“ƒTh, gŽÔÚ—p‚‹@”\‰æ‘œƒZƒ“ƒT‚ÌŠJ”­,h•l¼E“ŒŽO‰Í’nˆæ’m“IƒNƒ‰ƒXƒ^[‘n¬Ž–‹Æi‘æ2Šúj’†ŠÔ¬‰Ê”­•\‰ï,•l¼,2009.9.3

13.   ™ ¬Ý,ˆÉ“¡^–ç,ìlË“ñ,Žu—ç‘ñ–CÂŽR‘C¼‘º’qŒb, g‘ŠŠÖ‘½dƒTƒ“ƒvƒŠƒ“ƒO–@‚ð—p‚¢‚½’áƒmƒCƒYƒCƒ[ƒWƒZƒ“ƒT,h2009”N‰f‘œî•ñƒƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

14.   ˆÉ“¡^–ç,Md. Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,ìlË“ñ,‚ˆä@—E,ˆÀ“¡“¹‘¥, gŽÔŽÔŠÔE˜HŽÔŠÔŒõ’ʐMƒVƒXƒeƒ€—pCMOSƒCƒ[ƒWƒZƒ“ƒT,h2009”N‰f‘œî•ñƒƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

15.   ”Ñ“c“N–ç,ìlË“ñ,ˆÉ“¡^–ç, g‘½’iŠKŒXŽÎƒŠƒZƒbƒg“®ì‚É‚æ‚éƒmƒCƒY’ጸŒø‰Ê,h2009”N‰f‘œî•ñƒƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

16.   ìlË“ñ, g‚‘¬‚•ª‰ð”\A/D•ÏŠ·Ší‚Ì’á“d—͐݌v‹Zp‚ÉŠÖ‚·‚錤‹†,hi‹¤“¯Œ¤‹†¬‰ÊÐ‰îj, STARC‹ZpˆÚ“]Žx‰‡ƒZƒ~ƒi[,‰¡•l, 2009.8.18

17.   ìlË“ñ, gƒAƒiƒƒOLSI ‚Ì‹Zp“®Œü,hICDƒTƒ}[ƒXƒN[ƒ‹2009,”MŠC, 2009.8.4iµ‘ҍu‰‰j

18.   ˆÀ•xŒ[‘¾,“c‘ºr”Ž,ˆÉ“¡^–ç,ìlË“ñ, g–„‚ߍž‚݃_ƒCƒI[ƒh‚ð—p‚¢‚½‚Q’i“d‰×“]‘—Œ^’áŽG‰¹“dŽqƒVƒƒƒbƒ^,h‰f‘œî•ñƒƒfƒBƒAŠw‰ï‹Zp•ñ@î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï@‚VŒŽŒ¤‹†‰ï,IST2009-43, Vol.33,No30, pp13-16,“Œ‹ž,2009.7.24

19.   ìlË“ñ, g‚b‚l‚n‚rƒCƒ[ƒWƒZƒ“ƒT‚̍ŐV‹Zp“®Œü,hƒAƒhƒoƒ“ƒeƒXƒgƒAƒJƒfƒ~[,ŒQ”n,2009.7.8iµ‘ҍu‰‰j

20.   ìlË“ñ, g’´’áÁ”ï“d—͍‚‘¬A/D•ÏŠ·Ší‚ðŽÀŒ»‚·‚éƒfƒWƒ^ƒ‹ƒAƒVƒXƒg‹Zp‚ÉŠÖ‚·‚錤‹†,hSTARCŒ¤‹†Œv‰æà–¾‰ï, ‰¡•l,2009.6.1

21.   –pßá©,ÂŽR‘,“n•Ó‹±Žu,Ô–x’ms,¬™’q•F,ˆé•”Œ\ŒáA‹àŽq—Tˆê,—«³,¼ŽR•,ìlË“ñ, g‚P‚R‚‚ƒVƒ“ƒOƒ‹ƒGƒ“ƒhŒ^ƒTƒCƒNƒŠƒbƒNADC‚ð—p‚¢‚½‚‘¬’áƒmƒCƒYCMOSƒCƒ[ƒWƒZƒ“ƒT‚ÌŠJ”­,hLSI‚ƃVƒXƒeƒ€‚̃[ƒNƒVƒ‡ƒbƒv2009,–k‹ãB,@2009.5.19

22.   ‘S¬ú¹, ˆÀ•xŒ[‘¾, ˆÉ“¡^–ç, ìlË“ñ, gLinearized settling error calibration for a pipeline A/D converter using non-slewimg amplifiers,h LSI‚ƃVƒXƒeƒ€‚̃[ƒNƒVƒ‡ƒbƒv2009,–k‹ãB,@2009.5.19

23.   ’|‰º—TÍ, ìlË“ñ, g“d‰×”ro‹@”\‚ð—L‚·‚é–„‚ߍž‚ÝŒ^‚‘¬“d‰×“]‘—ƒtƒHƒgƒ_ƒCƒI[ƒh\‘¢‚ÌŒŸ“¢,h@LSI‚ƃVƒXƒeƒ€‚̃[ƒNƒVƒ‡ƒbƒv2009,–k‹ãB, 2009.5.19

24.   ìlË“ñ, gŽÔŽÔŠÔA˜HŽÔŠÔ‚̃Cƒ[ƒWƒZƒ“ƒT’ʐM,h‰ÂŽ‹Œõ’ʐMƒRƒ“ƒ\[ƒVƒAƒ€,“Œ‹ž,2009.4.28

25.   ìlË“ñ, gƒpƒCƒvƒ‰ƒCƒ“AD•ÏŠ·Ší‚̃fƒWƒ^ƒ‹ƒAƒVƒXƒg‹Zp,h‘æ22‰ñ‰ñ˜H‚ƃVƒXƒeƒ€Œyˆä‘òƒ[ƒNƒVƒ‡ƒbƒv, Ba1-3-2,Œyˆä‘ò,2009.4.20(invited)

26.   ìlË“ñ, g‚‘¬’áƒmƒCƒYLƒ_ƒCƒiƒ~ƒbƒNƒŒƒ“ƒWƒJƒ‰ƒ€Œ^A/D•ÏŠ·Ší‚Æ‚±‚ê‚ð—p‚¢‚½CMOSƒCƒ[ƒWƒZƒ“ƒT,hŽŸ¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“¥ƒVƒXƒeƒ€•”‰ï‘æ124‰ñ’è—á‰ï,“Œ‹ž,2009.4.10i”­•\‘㗝j

27.   J. H. Park, S. Aoyama, T. Watanabe, T. Akahori, T. Kosugi, K. Isobe, Y. Kaneko, Z. Liu, K. Muramatsu, T. Matsuyama, S. Kawahito, gA High-Speed Low-Noise CMOS Image Sensor with 13b Column-Parakkek Single-Ended Cyclic ADCs,h ‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï3ŒŽŒ¤‹†‰ï, IST2009-14, “Œ‹ž, 2009.3.

28.   ˆÉ“¡^–ç, MD. S. Z. Sarker, ˆÀ•xŒ[‘¾, ‰ªŒ©_Ž¡, ‚ˆä—E, ˆÀ“¡“¹‘¥, ìlË“ñ, gŽÔŽÔŠÔ¥˜HŽÔŠÔŒõ’ʐMƒVƒXƒeƒ€‚Ö‚ÌCMOSƒCƒ[ƒWƒZƒ“ƒT‹Zp‚̉ž—p‚ÆŒõŽóM‰æ‘f‰ñ˜H‚Ì“Á«•]‰¿h, ‰f‘œî•ñƒƒfƒBƒAŠw‰ïî•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï3ŒŽŒ¤‹†‰ï, IST2009-16, “Œ‹ž, 2009.3.

29.   ìlË“ñ, g’´‚Š´“x”ñ—â‹p‚b‚l‚n‚rƒCƒ[ƒWƒZƒ“ƒT,hƒIƒvƒgƒƒjƒNƒXƒtƒH[ƒ‰ƒ€2009in•l¼, •l¼, 2009.3. (Œ¤‹†¬‰Ê”­•\)

30.   A. Matsuzawa, G. Gielen, M. Hershenson, S. Kawahito, S. Dosho, gHow to design the future mixed signal LSI's,h SASIMI2009, Okinawa, 2009.3. (Invited, Panel discussion)

31.   ìlË“ñ, gƒfƒWƒ^ƒ‹ƒCƒ[ƒWƒZƒ“ƒT‚Ì‹Zp“®Œüh, ŽŸ¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“ƒVƒXƒeƒ€•”‰ï‘æ123‰ñ’è—á‰ï, “Œ‹ž, 2009.1.

32.   ìlË“ñ, ¬ìhˆê, gŽŸ¢‘ãƒfƒWƒ^ƒ‹ƒJƒƒ‰‚ƃCƒ[ƒWƒZƒ“ƒT,hŽŸ¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“ƒVƒXƒeƒ€•”‰ï‘æ123‰ñ’è—á‰ï, “Œ‹ž, 2009.1. (ƒpƒlƒ‹“¢˜_)