Noise analysis method of sampled analog circuits (e.g. switched-capacitor circuits) using transfer function-based and transient analyses are investigated. For both the thermal and 1/f noise components, the transfer function-based and the transient analyses of a high-gain column amplifier for CMOS image sensors are in good agreement.
|Signal readout circuit of a CMOS image sensor using switched-capacitor circuits.||Comparison of the two methods (Input referred r.m.s. noise).|