Papers

 

(2008)

1.         A. Shafie, S. Kawahito, H. J. Yoon, S. Ito, “A Dynamic Range Expansion Technique Using Dual Charge Storage in a CMOS APS and Multiple Exposures for Reduced Motion Blur”, J. Inst. Image Inf. TV Eng., vol.62, no.12, pp.2037-2044, Dec.2008.

2.         T. Sawada, K. Yasutomi, S.Itoh, “Kawahito Laboratory, Shizuoka University”, Flesh Eyes –Introduction of Video Research Laboratory-, J. Inst. Image Inf. TV Eng., vol.62, no.11, pp.1737-1740, Nov.2008. (in Japanese).

3.         S. Kawahito, I. Takayanagi, H. Takahashi, S. Sugawa, T. Misawa, J. Ohta, T. Hamamoto, H. Ohtake, K. Harada, A. Onoda, “The Recent Progress of Image Informationg and Television Engineers, Image Electron, Information Sensing”, J. Inst. Image Inf. TV Eng., vol.62, no.8, pp.1189-1197, Aug.2008. (in Japanese).

4.         S. Kawahito, “Techniques for Digitally Assisted Pipeline A/D Converters”, IEICE Trans. Electron., vol.E91-C, no.6, pp.829-836, Jun. 2008. (invited)

5.         S. Shafie, S. Kawahito, S. Itoh, “A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling”, MDPI sensors 2008,8, pp.1915-1926, Mar.2008.

6.         S. Kawahito, “Recent Progress of Three-dimensional Range Finders”, J. Inst. Image Inf. TV Eng., vol.62, no.3, pp.313-316, Mar. 2008. (in Japanese).

7.         S. Kawahito, H. J. Yoon, S. Itoh, “A CMOS Time-Resolved Sensor for Fluorescence Lifetime Imaging”, The 10th Takayanagi Kenjiro Memorial Symp. / The 5th Int. Symp. Nanovision Sciene, Hamamatsu, Nov.2008.

8.         T. Sawada, K. Ito, M. Nakayama, S. Kawahito, “TOF Range Image Sensor Using A Range-Shift Techniqu”, IEEE SENSORS2008, pp.1390-1393, Lecce, Italy, Oct.2008.

9.         T. Sawada, K. Ito, M. Nakayama, S. Kawahito, “A Range-Shift Technique for TOF Range Image Sensors”, The 25th Sensor Symp. Sensors, Micromachines, and Applied Systems, D5-5, Okinawa, Oct.2008.

10.     K. Yasutomi, T. Tamura, M. Furuta, S. Itoh, S. Kawahito, “A High-Speed CMOS Image Sensor with Global Electronic Shutter Pixels Using Pinned Diodes”, The 25th Sensor Symp. Sensors, Micromachines, and Applied Systems, D5-3, Okinawa, Oct.2008.

11.     H. J. Yoon, S. Ito, S. Kawahito, “A CMOS Image Sensor using Two-Stage Charge Transfer Structure for Fluorescence Lifetime Imaging with 100ps Time-Resolution”, The 25th Sensor Symp. Sensors, Micromachines, and Applied Systems , P-3-4(Poster), Okinawa, Oct.2008.

12.     S. Kawahito, K. Honda, Z. Liu, K. Yasutomi, S. Itoh, “A 15b Power-Efficient Pipeline A/D Converter Using Non-Slewing Closed-Loop Amplifiers”, IEEE Custom Integrated Circuits Conf., 7-7, pp.117-120, San Jose, Sept.2008.

13.     K. Yasutomi, T. Tamura, S. Ito, S. Kawahito, “A High-Speed CMOS Image Sensor with Global Electronic Shutter Pixel Using Pinned Diodes”, 7th Int. Conf. Global Research and Education Proceedings, pp.319-325, Pecs, Sept.2008.

14.     H.-J. Yoon, S. Itoh, S. Kawahito, “A CMOS Image Sensor using Two-Stage Charge Transfer Technique for Fluorescence Lifetime Imaging”, Euro Sensors 2008, W2A, pp.1474-1477, Dresden, Sept.2008.

15.     S. Itoh, S. Kawahito, “A low-power data transmission technique using inductive coupling and its application to biomedical sensor devices”, 2008 CMOS Emerging Technologies Workshop, 11B, Vancouver, Aug. 2008.

16.     Z. Liu, K.Honda, S.Kawahito, “A New Calibration Method for Sampling Clock Skew in Time-Interleaved ADC”, Proc. IEEE Int. Inst. Measurement Tech. Conf., pp.1107-1110, Victoria, May. 2008.

17.     S. Kawahito, “CMOS Time-of-Flight Range Image Sensors, The 4th Fraunhofer IMS Workshop on CMOS-Imaging CD-R, Duisburg, May 2008. (invited)

18.     S. Kawahito, J-H. Park, K. Isobe, S. Suhaidi, T. Iida, T. Mizota, “A CMOS Image Sensor Integrating Column-Parallel Cyclic ADCs with On-Chip Digital Error-Correction Circuits”, Dig. Tec. Papers 2008 IEEE Int. Solid-State Circuits Conf., pp.56-57, San Francisco, Feb.2008.

19.     S. B. Shafie, S. Kawahito, “A wide dynamic range image sensor with dual charge storage in a pixel and a multiple sampling technique”, Proc. SPIE Electronic Imaging 2008, vol.6816, San Jose, Jan.2008.

20.     S. Kawahito, S. Ito, “Noise calculation model and analysis of high-gain readout circuits for CMOS image sensors”, Proc. SPIE Electronic Imaging 2008, vol.6816, San Jose, Jan.2008.