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(2009)

1.         S.Kawahito,�gRecent progress of CMOS imaging devices,�h The 16th International Display Workshops(CD-R), INP1-1,Miyazaki,Dec.2009(Invited)

2.         M.A.Mustafa, S. Itoh, S. Kawahito,�gReduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis,�h Journal of Automation, Mobile, Robotics & Intelligent Systems, Vol.3, No.4, pp.202-203,2009

3.         S. Shafie, S. Kawahito, I. A. Halin, W. Z. W. Hasan, �gNon-linearity in wide dynamic range CMOS image sensors utilizing a partial charge transfer technique,�h Sensors2009,vol.9,no.12,pp.9452-9467, Dec.2009

4.         J. H. Park, S. Aoyama, T. Watanabe, K. Isobe, S. Kawahito, �gA high-speed low noise CMOS image sensor with 13-b column-parallel single-ended cyclic ADCs,�h IEEE Trans. on Electron Devices, vol.56,no.11, pp.2414-2422,Nov.2009

5.         T. Sawada, K. Ito, M. Nakayama, S. Kawahito,�gA range-shift technique for TOF range image sensors,�h IEEJ Trans. on Sensors and Micromachines, vol.129, no.11,Sec.E, pp.421-425, Nov.2009

6.         M. S. Z. Sarker, I. Takai, M. Andoh, K. Yasutomi, S. Itoh, S. Kawahito, �gA CMOS imager and 2-D light pulse receiver array for spatial optical communication,�h IEEE Asian Solid-State Circuits Conference(CD-R),pp.113-116,Taipei, Nov.2009

7.         S. Kawahito, �gRecent progress of CMOS image sensors,�h The 11th Takayanagi Kenjiro Memorial Symposium,program,Hamamatsu,Nov.2009

8.         K. Yasutomi, T. Tamura, M. Furuta, S. Itoh, S. Kawahito,�gA high-speed CMOS image sensor with global electronic shutter pixels using pinned diodes,�h IEEJ Trans. on Sensors and Micromachines, vol.129, no.10, pp.321-327,Oct.2009

9.         S. W. Jun, K. Yasutomi, S. Itoh, S. Kawahito,�gLinearized settling error calibration for a pipeline A/D converter using non-slewing amplifiers,�h Inter-Academia2009, vol.3,no.4, pp.204-206, Kazimierz,Sep.2009

10.     M. A. B. Mustafa, S. Itoh, S. Kawahito, �gReduction of random telegraph signal (RTS) noise in CMOS image sensors using histogram analysis,�hInter-Academia2009, vol.3,no.4, pp.202-203,Kazimierz,Sep.2009

11.     �ì�l�Ë“ñ,‚Ó‚§�[‚©‚·,�g�î•ñƒZƒ“ƒVƒ“ƒO‚ÆŽY‹Æ˜AŒg�h,‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ïŽ�,vol.63,no.8,Šª“ªƒy�[ƒW,2009.8

12.     �ì�l�Ë“ñ,Œ¤‹†Žº‚¾‚æ‚è,�ɪ‘åŠw“dŽq�HŠwŒ¤‹†�ŠƒCƒ��[ƒWƒ“ƒOƒfƒoƒCƒX•ª–ì,“d‹CŠw‰ï˜_•¶Ž�‚d�CƒZƒ“ƒTƒ}ƒCƒNƒ�ƒ}ƒVƒ“•”–åŽ�vol..129 ,no.8,pp.272,2009.8

13.     K. Yasutomi, S. Itoh, S. Kawahito, T. Tamura,�gTwo-stage charge transfer pixel using pinned diodes for low-noise global shutter imaging,�h Int. Image Sensor w/s,pp.333-336, Bergen,Jun.2009

14.     S. Kawahito, S. Suh, T. Shirei, S. Ito, �gNoise reduction effect of column-parallel correlated multiple sampling for CMOS image sensors,�hInt. Image Sensor w/s, Bergen, pp.320-323, Jun.2009

15.     T. Watanabe, J. H. Park, S. Aoyama, K. Isobe, S. Kawahito,�gEffects of negative bias operation and optical stress on dark current,�hInt. Image Sensor w/s, pp. 107-110,Bergen,Jun.2009(poster)

16.     S.Suh, S.Itoh, S.Kawahito, T.Shirei, S.Aoyama, C.Nishimura,�gNoise reduction effect of column-parallel correlated multiple sampling for CMOS image sensors,�hEOS Conferences 2009(CD-R), pp15, Munich,Jun.2009

17.     �ì�l�Ë“ñ,�@Œ¤‹†Žº�Љî�g�‚‘¬�‚•ª‰ð”\A/D•ÏŠ·Ší‚Ì’á“d—Í�ÝŒv‹Z�p‚ÉŠÖ‚·‚錤‹†,�h”¼“±‘Ì�ÝŒv�Å‘O�ü2009�@–¢—ˆ‚ð�Ø‚è‘ñ‚­”¼“±‘Ì‹Z�p�@“úŒoƒ}ƒCƒNƒ�ƒfƒoƒCƒX“Á•Ê•Ò�W”Å,�@pp.84-85,2009

18.     S. Kawahito, �gCMOS Image Sensors Building Blocks,�h UPM, Selangor, Malaysia, Mar.2009.(Invited)

19.     H. J. Yoon, S. Itoh, S. Kawahito, �gA CMOS Image Sensor with In-Pixel Two-Stage Charge Transfer for Fluorescence Lifetime Imaging,�h IEEE Trans. Electron Devices, vol.56,no.2, pp.214-221, Feb.2009.

20.     A. Matsuzawa, G. Gielen, M. Hershenson, S. Kawahito, S. Dosho, �gHow to design the future mixed signal LSI's,�h Proc. SASIMI2009, p.485, Okinawa, Mar.2009. (Invited, Panel discussion)

21.     J. H. Park, S. Aoyama, T. Watanabe, T. Akahori, T. Kosugi, K. Isobe, Y. Kaneko, Z. Liu, K. Muramatsu, T. Matsuyama, S. Kawahito, �gA 0.1e -Vertical FPN 4.7e- Read Noise 71dB DR CMOS Image Sensor with 13b Column-Parallel Single-Ended Cyclic ADCs,�h 2009 IEEE Int. Solid-State Circuits Conf. Dig. Tech. Papers, 15-3, pp.268-269, San Francisco, Feb.2009.

22.     Md. S. Z. Sarker, I. Takai, M. Andoh, K. Yasutomi, S. Itoh, S. Kawahito, �gA CMOS Active Pixel Sensor for Optical Communication,�h IS&T Electronic Imaging Science and Tech., 7249-21, San Jose, Jan.2009.

23.     K. Yasutomi, T. Tamura, M. Furuta, S. Kawahito, S. Ito, S. Kawahito, �gA global electronic shutter pixel using pinned diodes fabricated in standard CMOS-image sensor technology,�h IS&T Electronic Imaging Science and Tech., 7249-14, San Jose, Jan.2009.

 

�‘“àŒû“ª”­•\

(2009)

1.      �ì�l�Ë“ñ, �gCMOS‹@”\�W�σZƒ“ƒT,�h IEEE–¼ŒÃ‰®Žx•” ‘�‰ïFellow Žó�Ü‹L”O�u‰‰‰ï, –¼ŒÃ‰®, 2009.12.19

2.      à_ˆä”R‘¾,ˆÉ“¡�^–ç,Md. Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,�‚ˆä�@—E,ˆÀ“¡“¹‘¥,�ì�l�Ë“ñ, �gŽÔŽÔŠÔ�E˜HŽÔŠÔŒõ’Ê�M—pCMOSƒCƒ��[ƒWƒZƒ“ƒT‚ÆLEDŒõŒ¹‚ð—p‚¢‚½’Ê�M‹——£‚Ì•]‰¿ŽÀŒ±,�h“dŽq�î•ñ’Ê�MŠw‰ï�W�ωñ˜HŒ¤‹†‰ï12ŒŽŒ¤‹†‰ïŠw�¶�EŽáŽèŒ¤‹†‰ï,•l�¼, 2009.12.14(ƒ|ƒXƒ^�[)

3.      �ÂŽR‘�,–p�ßá©,“n•Ó‹±Žu,�ì�l�Ë“ñ, �gƒCƒ��[ƒWƒZƒ“ƒT�@�` ‚»‚Ì–£—Í‚Æ�ÝŒv‚̓‚³ �`,�h “dŽq�î•ñ’Ê�MŠw‰ï�W�ωñ˜HŒ¤‹†‰ï12ŒŽŒ¤‹†‰ïŠw�¶�EŽáŽèŒ¤‹†‰ï,•l�¼, 2009.12.14(�µ‘Ò�u‰‰)

4.      �‚ˆä—E,‘¾“c�[•F,–Ø‘º�D�Ž,ˆÀ“¡“¹‘¥,Md.Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,à_ˆä”R‘¾,ˆÉ“¡�^–ç,�ì�l�Ë“ñ, �gƒCƒ��[ƒWƒZƒ“ƒT‚É‚æ‚éŽÔŽÔ�E˜HŽÔŠÔ’Ê�M‚Ì‚½‚߂̌õ‹óŠÔ’Ê�MƒVƒXƒeƒ€,�hViEW2009,‰¡•l,2009.12.3

5.      �ì�l�Ë“ñ, �g‹@”\�W�σCƒ��[ƒWƒ“ƒOƒfƒoƒCƒX‚Ɖ摜ƒZƒ“ƒVƒ“ƒO‚ւ̉ž—p,�h ŽO•H“d‹@�æ’[‹Z�p‘��‡Œ¤‹†�Š,•ºŒÉ,2009.11.24(�µ‘Ò�u‰‰)                                                                               

6.      �ì�l�Ë“ñ, �gŽžŠÔ•ª‰ðŽB‘œƒfƒoƒCƒX‹Z�p‚Ɖž—p- ‹É’ZŽžŠÔ‰ž“šƒsƒNƒZƒ‹‚ð—p‚¢‚½Œõ”ò�sŽžŠÔŒ^ƒŒƒ“ƒWƒtƒ@ƒCƒ“ƒ_�AŒuŒõŽõ–½‚É’…–Ú‚µ‚½ƒoƒCƒIƒCƒ��[ƒWƒ“ƒO‚ւ̉ž—p,�h, JSTInnovation Bridge �ɪ‘åŠwŒ¤‹†ƒV�[ƒY”­•\‰ï,“Œ‹ž,2009.10.19

7.      Z. Li,H.J. Yoon,S. Itoh,S.Kawahito, �gTime domain fluorescence lifetime image sensor using two-stage charge transfer pixels with pinned diode,�h ‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï�î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï�@�W�ωñ˜HŒ¤‹†‰ï,“Œ‹ž, 2009.10.1

8.      ’|‰º—T�Í�E”Ñ“c“N–ç�EˆÀ•xŒ[‘¾�E�ì�l�Ë“ñ, �g–„‚ß�ž‚ÝŒ^�‚‘¬“d‰×“]‘—ƒtƒHƒgƒ_ƒCƒI�[ƒh‚ð—p‚¢‚½TOF‹——£‰æ‘œƒZƒ“ƒT‚ÌŽŽ�ì,�h‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï�î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï�W�ωñ˜HŒ¤‹†‰ï,“Œ‹ž, 2009.10.1

9.      “n•Ó‹±Žu, –p�ßá©,�ÂŽR‘�,ˆé•”Œ\Œá,�ì�l�Ë“ñ, �gCMOSƒCƒ��[ƒWƒZƒ“ƒT‚̈Ód—¬‚ɑ΂·‚镉“dˆ³‹ì“®‚¨‚æ‚ÑŒõƒXƒgƒŒƒX‚ÌŒø‰Ê,�h‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï�î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï�iIST�j,“Œ‹ž, 2009.9.28

10.   S. Suh,S. Itoh,T. Iida,S. Kawahito, �gNoise reduction effects of column-parallel multiple sampling circuits,�h‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï�î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï�iIST�j,“Œ‹ž, 2009.9.28

11.   �ì�l�Ë“ñ, �gCMOSƒCƒ��[ƒWƒZƒ“ƒT‚Ì‹Z�p“®Œü,�h“dŽqƒWƒƒ�[ƒiƒ‹‘æ216‰ñTechnical Symposium,2009�HCCD/CMOSƒCƒ��[ƒWƒZƒ“ƒT“O’ꌟ�Ø,“Œ‹ž, 2009.9.25(�µ‘Ò�u‰‰)

12.   �ì�l�Ë“ñ, �g’´�‚Š´“x”ñ—â‹pCMOSƒCƒ��[ƒWƒZƒ“ƒT�h, �gŽÔ�Ú—p�‚‹@”\‰æ‘œƒZƒ“ƒT‚ÌŠJ”­,�h•l�¼�E“ŒŽO‰Í’nˆæ’m“IƒNƒ‰ƒXƒ^�[‘n�¬Ž–‹Æ�i‘æ2Šú�j’†ŠÔ�¬‰Ê”­•\‰ï,•l�¼,2009.9.3

13.   �™ �¬�Ý,ˆÉ“¡�^–ç,�ì�l�Ë“ñ,Žu—ç‘ñ–��C�ÂŽR‘��C�¼‘º’qŒb, �g‘ŠŠÖ‘½�dƒTƒ“ƒvƒŠƒ“ƒO–@‚ð—p‚¢‚½’áƒmƒCƒYƒCƒ��[ƒWƒZƒ“ƒT,�h2009”N‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

14.   ˆÉ“¡�^–ç,Md. Shakowat Zaman Sarker,ˆÀ•xŒ[‘¾,�ì�l�Ë“ñ,�‚ˆä�@—E,ˆÀ“¡“¹‘¥, �gŽÔŽÔŠÔ�E˜HŽÔŠÔŒõ’Ê�MƒVƒXƒeƒ€—pCMOSƒCƒ��[ƒWƒZƒ“ƒT,�h2009”N‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

15.   ”Ñ“c“N–ç,�ì�l�Ë“ñ,ˆÉ“¡�^–ç, �g‘½’iŠKŒXŽÎƒŠƒZƒbƒg“®�ì‚É‚æ‚éƒmƒCƒY’ጸŒø‰Ê,�h2009”N‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï”NŽŸ‘å‰ï,“Œ‹ž, 2009.8.28

16.   �ì�l�Ë“ñ, �g�‚‘¬�‚•ª‰ð”\A/D•ÏŠ·Ší‚Ì’á“d—Í�ÝŒv‹Z�p‚ÉŠÖ‚·‚錤‹†,�h�i‹¤“¯Œ¤‹†�¬‰Ê�Љî�j, STARC‹Z�pˆÚ“]Žx‰‡ƒZƒ~ƒi�[,‰¡•l, 2009.8.18

17.   �ì�l�Ë“ñ, �gƒAƒiƒ�ƒOLSI ‚Ì‹Z�p“®Œü,�hICDƒTƒ}�[ƒXƒN�[ƒ‹2009,”MŠC, 2009.8.4�i�µ‘Ò�u‰‰�j

18.   ˆÀ•xŒ[‘¾,“c‘º�r”Ž,ˆÉ“¡�^–ç,�ì�l�Ë“ñ, �g–„‚ß�ž‚݃_ƒCƒI�[ƒh‚ð—p‚¢‚½‚Q’i“d‰×“]‘—Œ^’áŽG‰¹“dŽqƒVƒƒƒbƒ^,�h‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï‹Z�p•ñ���@�î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï�@‚VŒŽŒ¤‹†‰ï,IST2009-43, Vol.33,No30, pp13-16,“Œ‹ž,2009.7.24

19.   �ì�l�Ë“ñ, �g‚b‚l‚n‚rƒCƒ��[ƒWƒZƒ“ƒT‚Ì�Å�V‹Z�p“®Œü,�hƒAƒhƒoƒ“ƒeƒXƒgƒAƒJƒfƒ~�[,ŒQ”n,2009.7.8�i�µ‘Ò�u‰‰�j

20.   �ì�l�Ë“ñ, �g’´’á�Á”ï“d—Í�‚‘¬A/D•ÏŠ·Ší‚ðŽÀŒ»‚·‚éƒfƒWƒ^ƒ‹ƒAƒVƒXƒg‹Z�p‚ÉŠÖ‚·‚錤‹†,�hSTARCŒ¤‹†Œv‰æ�à–¾‰ï, ‰¡•l,2009.6.1

21.   –p�ßá©,�ÂŽR‘�,“n•Ó‹±Žu,�Ô–x’m�s,�¬�™’q•F,ˆé•”Œ\Œá�A‹àŽq—Tˆê,—«�³,�¼ŽR•�,�ì�l�Ë“ñ, �g‚P‚R‚‚ƒVƒ“ƒOƒ‹ƒGƒ“ƒhŒ^ƒTƒCƒNƒŠƒbƒNADC‚ð—p‚¢‚½�‚‘¬’áƒmƒCƒYCMOSƒCƒ��[ƒWƒZƒ“ƒT‚ÌŠJ”­,�hLSI‚ƃVƒXƒeƒ€‚̃��[ƒNƒVƒ‡ƒbƒv2009,–k‹ã�B,�@2009.5.19

22.   ‘S�¬ú¹, ˆÀ•xŒ[‘¾, ˆÉ“¡�^–ç, �ì�l�Ë“ñ, �gLinearized settling error calibration for a pipeline A/D converter using non-slewimg amplifiers,�h LSI‚ƃVƒXƒeƒ€‚̃��[ƒNƒVƒ‡ƒbƒv2009,–k‹ã�B,�@2009.5.19

23.   ’|‰º—T�Í, �ì�l�Ë“ñ, �g“d‰×”r�o‹@”\‚ð—L‚·‚é–„‚ß�ž‚ÝŒ^�‚‘¬“d‰×“]‘—ƒtƒHƒgƒ_ƒCƒI�[ƒh�\‘¢‚ÌŒŸ“¢,�h�@LSI‚ƃVƒXƒeƒ€‚̃��[ƒNƒVƒ‡ƒbƒv2009,–k‹ã�B, 2009.5.19

24.   �ì�l�Ë“ñ, �gŽÔŽÔŠÔ�A˜HŽÔŠÔ‚̃Cƒ��[ƒWƒZƒ“ƒT’Ê�M,�h‰ÂŽ‹Œõ’Ê�MƒRƒ“ƒ\�[ƒVƒAƒ€,“Œ‹ž,2009.4.28

25.   �ì�l�Ë“ñ, �gƒpƒCƒvƒ‰ƒCƒ“AD•ÏŠ·Ší‚̃fƒWƒ^ƒ‹ƒAƒVƒXƒg‹Z�p,�h‘æ22‰ñ‰ñ˜H‚ƃVƒXƒeƒ€Œyˆä‘òƒ��[ƒNƒVƒ‡ƒbƒv, Ba1-3-2,Œyˆä‘ò,2009.4.20(invited)

26.   �ì�l�Ë“ñ, �g�‚‘¬’áƒmƒCƒY�Lƒ_ƒCƒiƒ~ƒbƒNƒŒƒ“ƒWƒJƒ‰ƒ€Œ^A/D•ÏŠ·Ší‚Æ‚±‚ê‚ð—p‚¢‚½CMOSƒCƒ��[ƒWƒZƒ“ƒT,�hŽŸ�¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“¥ƒVƒXƒeƒ€•”‰ï‘æ124‰ñ’è—á‰ï,“Œ‹ž,2009.4.10�i”­•\‘ã—��j

27.   J. H. Park, S. Aoyama, T. Watanabe, T. Akahori, T. Kosugi, K. Isobe, Y. Kaneko, Z. Liu, K. Muramatsu, T. Matsuyama, S. Kawahito, �gA High-Speed Low-Noise CMOS Image Sensor with 13b Column-Parakkek Single-Ended Cyclic ADCs,�h ‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï�î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï3ŒŽŒ¤‹†‰ï, IST2009-14, “Œ‹ž, 2009.3.

28.   ˆÉ“¡�^–ç, MD. S. Z. Sarker, ˆÀ•xŒ[‘¾, ‰ªŒ©�_Ž¡, �‚ˆä—E, ˆÀ“¡“¹‘¥, �ì�l�Ë“ñ, �gŽÔŽÔŠÔ¥˜HŽÔŠÔŒõ’Ê�MƒVƒXƒeƒ€‚Ö‚ÌCMOSƒCƒ��[ƒWƒZƒ“ƒT‹Z�p‚̉ž—p‚ÆŒõŽó�M‰æ‘f‰ñ˜H‚Ì“Á�«•]‰¿�h, ‰f‘œ�î•ñƒ�ƒfƒBƒAŠw‰ï�î•ñƒZƒ“ƒVƒ“ƒOŒ¤‹†‰ï3ŒŽŒ¤‹†‰ï, IST2009-16, “Œ‹ž, 2009.3.

29.   �ì�l�Ë“ñ, �g’´�‚Š´“x”ñ—â‹p‚b‚l‚n‚rƒCƒ��[ƒWƒZƒ“ƒT,�hƒIƒvƒgƒ�ƒjƒNƒXƒtƒH�[ƒ‰ƒ€2009in•l�¼, •l�¼, 2009.3. (Œ¤‹†�¬‰Ê”­•\)

30.   A. Matsuzawa, G. Gielen, M. Hershenson, S. Kawahito, S. Dosho, �gHow to design the future mixed signal LSI's,�h SASIMI2009, Okinawa, 2009.3. (Invited, Panel discussion)

31.   �ì�l�Ë“ñ, �gƒfƒWƒ^ƒ‹ƒCƒ��[ƒWƒZƒ“ƒT‚Ì‹Z�p“®Œü�h, ŽŸ�¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“ƒVƒXƒeƒ€•”‰ï‘æ123‰ñ’è—á‰ï, “Œ‹ž, 2009.1.

32.   �ì�l�Ë“ñ, �¬�ì�hˆê, �gŽŸ�¢‘ãƒfƒWƒ^ƒ‹ƒJƒ�ƒ‰‚ƃCƒ��[ƒWƒZƒ“ƒT,�hŽŸ�¢‘ã‰æ‘œ“ü—̓rƒWƒ‡ƒ“ƒVƒXƒeƒ€•”‰ï‘æ123‰ñ’è—á‰ï, “Œ‹ž, 2009.1. (ƒpƒlƒ‹“¢˜_)